SURFACE X-RAY-DIFFRACTION

被引：635

作者：

ROBINSON, IK ^{[1
]}

TWEET, DJ ^{[1
]}

机构：

[1] UNIV WASHINGTON,DEPT PHYS,SEATTLE,WA 98195

来源：

REPORTS ON PROGRESS IN PHYSICS | 1992年 / 55卷 / 05期

关键词：

D O I：

10.1088/0034-4885/55/5/002

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A general introduction to x-ray diffraction and its application to the study of surfaces and interfaces is presented. The application of x-ray diffraction to various problems in surface and interface science is illustrated through five different techniques: crystal truncation rod analysis, two-dimensional crystallography, three-dimensional structure analysis, the evanescent wave method and lineshape analysis. These techniques are explained with numerous examples from recent experiments and with the aid of an extensive bibliography.

引用

页码：599 / 651

页数：53

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