IMPACT OF A SINGLE DEFECT ON THE CONDUCTANCE - LOCAL INTERFERENCE AND UNIVERSAL CONDUCTANCE FLUCTUATIONS

被引：12

作者：

RALLS, KS ^{[1
]}

RALPH, DC ^{[1
]}

BUHRMAN, RA ^{[1
]}

机构：

[1] LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94550

来源：

PHYSICAL REVIEW B | 1993年 / 47卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.47.10509

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

By reversibly reconfiguring a single defect in a mesoscopic copper nanobridge < 10 nm wide, we have measured both the local interference and universal-conductance-fluctuation contributions to the impact of a single defect on the conductance. Both effects are in good agreement with the predictions of theory, despite the fact that the defects that reconfigure are more complicated than simple point defects.

引用

页码：10509 / 10514

页数：6

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