FIELD-ION IMAGE QUALITIES OF GA, IN AND SN ON W AND WORK FUNCTIONS

被引：4

作者：

NISHIKAWA, O ^{[1
]}

SAADAT, AR ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT PHYS,UNIVERSITY PK,PA 16802

来源：

SURFACE SCIENCE | 1978年 / 70卷 / 01期

关键词：

D O I：

10.1016/0039-6028(78)90417-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：292 / 301

页数：10

共 17 条

[1]

Gomer R., 1961, FIELD EMISSION FIELD

[2]

Good RH., 1956, FIELD EMISSION, P176

[3]

Muller E W, 1969, FIELD ION MICROSCOPY

[4]

Muller E. W., 1960, ADV ELECTRON, V13, P83, DOI 10.1016/S0065-2539(08)60210-3

[5] FIELD ADSORPTION AND DESORPTION OF HELIUM AND NEON [J].

MULLER, EW ;

MCLANE, SB ;

PANITZ, JA .

SURFACE SCIENCE, 1969, 17 (02) :430-&

[6] GAS-SURFACE INTERACTIONS AND FIELD-ION MICROSCOPY OF NONREFRACTORY METALS [J].

MULLER, EW ;

NAKAMURA, S ;

NISHIKAWA, O ;

MCLANE, SB .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (08) :2496-+

[7] WORK FUNCTION OF TUNGSTEN SINGLE CRYSTAL PLANES MEASURED BY THE FIELD EMISSION MICROSCOPE [J].

MULLER, EW .

JOURNAL OF APPLIED PHYSICS, 1955, 26 (06) :732-737

[8]

MULLER EW, 1968, SURFACE SCI, V8, P462

[9] FIELD-ION MICROSCOPY OF COBALT [J].

NISHIKAW.O ;

MULLER, EW .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (08) :3159-&

[10] OPERATION OF FIELD ION MICROSCOPE WITH NEON [J].

NISHIKAWA, O ;

MULLER, EW .

JOURNAL OF APPLIED PHYSICS, 1964, 35 (10) :2806-&

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