OBSERVATION OF CRYSTALLIZATION OF VAPOR-DEPOSITED TPD FILMS BY AFM AND FFM

被引：115

作者：

HAN, EM ^{[1
]}

DO, LM ^{[1
]}

NIIDOME, Y ^{[1
]}

FUJIHIRA, M ^{[1
]}

机构：

[1] TOKYO INST TECHNOL, DEPT BIOMOLEC ENGN, MIDORI KU, YOKOHAMA 227, JAPAN

来源：

CHEMISTRY LETTERS | 1994年 / 05期

关键词：

D O I：

10.1246/cl.1994.969

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The morphological change of vapor-deposited TPD (N,N'-diphenyl-N,N'-bis-(3-methylphenyl)-[1,1'-biphenyl]-4,4'-diamine) firms, used as the here transport layer of organic electroluminescent (EL) devices, on a grass plate was observed by atomic force microscopy (AFM) and friction force microscopy (FFM) in an ambient atmosphere. The TPD film was flat and amorphous as deposited, but was crystallized partially about a week later. By friction force loop measurement, we found that the bare glass surface was revealed between the crystals and between the amorphous film and the crystal due to mass transport for crystallization of TPD from the amorphous film.

引用

页码：969 / 972

页数：4

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