X-RAY TOPOGRAPHIC STUDY OF LARGE CRYSTALS FOR A BENT-CRYSTAL GAMMA DIFFRACTOMETER

被引：10

作者：

JACOBS, L

HART, M

机构：

[1] LEUVEN UNIV,LEUVEN,BELGIUM

[2] UNIV BRISTOL,HH WILLS PHYS LAB,ROYAL FT,BRISTOL,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 143卷 / 02期

关键词：

D O I：

10.1016/0029-554X(77)90614-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：319 / 325

页数：7

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[9] A HIGH RESOLVING POWER, CURVED-CRYSTAL FOCUSING SPECTROMETER FOR SHORT WAVE-LENGTH X-RAYS AND GAMMA-RAYS [J].

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