SIMULATIONS OF THE REMANENT BEHAVIOR OF LONGITUDINAL THIN-FILMS

被引:5
作者
DEAN, C
CHANTRELL, RW
HART, A
PARKER, DA
OGRADY, K
机构
[1] UNIV KEELE,DEPT PHYS,KEELE ST5 5BG,STAFFS,ENGLAND
[2] UNIV CENT LANCASHIRE,DEPT MATH & STAT,PRESTON,LANCS PR1 2HE,ENGLAND
[3] UNIV COLL N WALES,SCH ELECTR ENGN SCI,BANGOR,GWYNEDD,WALES
关键词
D O I
10.1109/20.281283
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A computer model of a longitudinal thin film has been developed and applied to a study of the remanent behaviour of the films. The exchange coupling between grains is shown to give rise to a difficulty of obtaining an ac erased state, this being interpreted in terms of the resultant cooperative magnetisation reversal involving large areas of the film. Exchange coupling is also responsible for the positive delta I parameter determined by comparison of remanence curves. However, the delta I plot is shown to be dependent on the detailed behaviour of exchange and magnetostatic coupling between grains.
引用
收藏
页码:3727 / 3729
页数:3
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