BAND-EDGE LUMINESCENCE OF STRAINED SIXGE1-X/SI SINGLE QUANTUM-WELL STRUCTURES GROWN ON SI(111) BY SI MOLECULAR-BEAM EPITAXY

被引:9
作者
FUKATSU, S
USAMI, N
SHIRAKI, Y
机构
[1] Research Center for Advanced Science and Technology (RCAST), The Universiry of Tokyo, Tokyo, 153, 4-6-1 Komaba, Meguro-ku
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1992年 / 31卷 / 8A期
关键词
BAND-EDGE LUMINESCENCE; STRAINED SIGE/SI SINGLE QUANTUM WELL; SI(111); SI MOLECULAR BEAM EPITAXY;
D O I
10.1143/JJAP.31.L1018
中图分类号
O59 [应用物理学];
学科分类号
摘要
Band-edge luminescence, no-phonon transitions due to symmetry-breaking alloy disordering in SiGe layers and transverse optical phonon replicas, were observed for the first time in Si0.8Ge0.2/Si single quantum well (SQW) structures grown on Si(111) substrates. SQWs were successfully grown by "solid source" Si molecular beam epitaxy at temperatures above 700-degrees-C strictly retaining well-ordered surface reconstruction as disclosed by intense Laue spots in in situ electron diffraction images. Low temperature growth was invariably associated with development of streaky features and was found to be detrimental to luminescence efficiency.
引用
收藏
页码:L1018 / L1020
页数:3
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