ANALYTICAL-CHEMISTRY OF SURFACES .3. ION SPECTROSCOPY

[1] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625

[2] CHIN RI, 1980, THESIS U PITTSBURGH

[3] STATIC SECONDARY ION MASS-SPECTROMETRY OF POLYMER SYSTEMS [J]. ANALYTICAL CHEMISTRY, 1980, 52 (02) : 226 - 232

[4] ANALYTICAL-CHEMISTRY OF SURFACES .1. GENERAL-ASPECTS [J]. JOURNAL OF CHEMICAL EDUCATION, 1984, 61 (05) : 402 - 409

[5] ANALYTICAL-CHEMISTRY OF SURFACES .2. ELECTRON-SPECTROSCOPY [J]. JOURNAL OF CHEMICAL EDUCATION, 1984, 61 (06) : 483 - 489

[6] MCHUGH JA, 1975, METHODS SURFACE ANAL, pCH6

[7] SPARROW GR, ASTM SPECIAL PUBLICA, V643

[8] SPARROW GR, 1977, JUN SME C CHIC

[9] USE OF SECONDARY ION MASS-SPECTROMETRY IN SURFACE ANALYSIS [J]. SURFACE SCIENCE, 1975, 47 (01) : 301 - 323

[10] ANALYSIS OF SURFACE COMPOSITION BY ION SCATTERING SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1975, 47 (01) : 146 - 148

[1] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625

[2] CHIN RI, 1980, THESIS U PITTSBURGH

[3] STATIC SECONDARY ION MASS-SPECTROMETRY OF POLYMER SYSTEMS [J]. ANALYTICAL CHEMISTRY, 1980, 52 (02) : 226 - 232

[4] ANALYTICAL-CHEMISTRY OF SURFACES .1. GENERAL-ASPECTS [J]. JOURNAL OF CHEMICAL EDUCATION, 1984, 61 (05) : 402 - 409

[5] ANALYTICAL-CHEMISTRY OF SURFACES .2. ELECTRON-SPECTROSCOPY [J]. JOURNAL OF CHEMICAL EDUCATION, 1984, 61 (06) : 483 - 489

[6] MCHUGH JA, 1975, METHODS SURFACE ANAL, pCH6

[7] SPARROW GR, ASTM SPECIAL PUBLICA, V643

[8] SPARROW GR, 1977, JUN SME C CHIC

[9] USE OF SECONDARY ION MASS-SPECTROMETRY IN SURFACE ANALYSIS [J]. SURFACE SCIENCE, 1975, 47 (01) : 301 - 323

[10] ANALYSIS OF SURFACE COMPOSITION BY ION SCATTERING SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1975, 47 (01) : 146 - 148