AUTOMATED VISUAL INSPECTION - 1981 TO 1987

被引：114

作者：

CHIN, RT

机构：

[1] Univ of Wisconsin, Madison, WI, USA, Univ of Wisconsin, Madison, WI, USA

来源：

COMPUTER VISION GRAPHICS AND IMAGE PROCESSING | 1988年 / 41卷 / 03期

基金：

美国国家科学基金会;

关键词：

COMPUTER PROGRAMMING - Algorithms - PATTERN RECOGNITION - PRINTED CIRCUITS - Inspection - VISION - Artificial - WELDS - Inspection;

D O I：

10.1016/0734-189X(88)90108-9

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

This bibliography lists journal publications, conference papers, research technical reports, and articles from trade journals on automated visual inspection for industry which were published during the years from 1981 to 1987. More than 600 references are included. References are organized into 13 categories according to subject matter. The categories are (1) books, (2) conferences and workshops, (3) general discussions and surveys, (4) inspection of printed circuit patterns, (5) inspection of solder joints, (6) inspection of microcircuit photomasks, (7) inspection of integrated circuits and hybrids, (8) inspection of other electrical and electronics components, (9) surface inspection, (10) X-ray inspection, (11) other inspection applications, (12) system components and (13) inspection algorithms.

引用

页码：346 / 381

页数：36

共 650 条

[1]

ABAKUMOV VG, 1983, SOV J NONDESTR TEST+, V19, P374

[2]

ABBOTT EH, 1983, FEB SME APPL MACH VI

[3]

ABRAMOVICH A, 1983, NOV P IEEE IECON 83, P90

[4]

Adams R. L., 1985, Printed Circuit Fabrication, V8

[5]

ADAWAY WGL, 1982, P SPIE OPTICAL SENSI, V376, P103

[6]

Ade F., 1984, Seventh International Conference on Pattern Recognition (Cat. No. 84CH2046-1), P428

[7]

AHLERS RJ, 1986, P SPIE AUTOMATED INS, V730

[8]

AHUJA N, 1983, PATTERN MODELS

[9]

Ajit C. N., 1984, Proceedings IECON '84. 1984 International Conference on Industrial Electronics, Control and Instrumentation (Cat. No. 84CH1991-9), P499

[10]

AKIYAMA N, 1984, B JPN SOC PREC ENG, V18, P165

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