EFFECTS OF CRYSTALLINITY AND ELECTRON MEAN-FREE-PATH ON DIELECTRIC STRENGTH OF LOW-DENSITY POLYETHYLENE

被引:49
作者
TANAKA, Y
OHNUMA, N
KATSUNAMI, K
OHKI, Y
机构
[1] Department of Electrical Engineering, Waseda University, Tokyo
[2] Process Dept., Bipolar Div., Atsugi Technology Center, Sony Co., Kanagawa
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1991年 / 26卷 / 02期
关键词
D O I
10.1109/14.78326
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The relation between crystallinity and the mean free path of high-energy electrons in low-density polyethylene and their effects on dielectric strength was studied. Thin LDPE films obtained by vacuum evaporation were annealed at temperatures between room temperature and 100-degrees-C. Crystallinity was measured by X-ray diffraction. Electrons were injected into the film by photo-emission and the energy of electrons emitted into vacuum through the film was analyzed to obtaine their energy distribution. The mean free path was then calculated from the energy distribution. It was found that the crystallinity increases and the mean free path becomes longer as the annealing temperature increases. Dielectric strength was measured by applying an impulse voltage of 1.2/50-mu-s at room temperature and -50-degrees-C. It was found that the breakdown field decreases with an increase in annealing temperature at both measurement temperatures. Thus, increased crystallinity makes electron transport easier and the mean-free-path longer, resulting in a lower dielectric strength.
引用
收藏
页码:258 / 265
页数:8
相关论文
共 17 条
[1]   DETERMINATION OF CRYSTALLINITY IN POLYETHYLENE BY X-RAY DIFFRACTOMETER [J].
AGGARWAL, SL ;
TILLEY, GP .
JOURNAL OF POLYMER SCIENCE, 1955, 18 (87) :17-26
[2]   DEGRADATION OF POLYMERIC INSULATION DUE TO PHOTOEMISSION CAUSED BY HIGH ELECTRIC-FIELDS [J].
BAMJI, SS ;
BULINSKI, AT ;
DENSLEY, RJ .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (01) :91-98
[3]   FIELD-ENHANCING DEFECTS IN POLYMERIC INSULATORS CAUSING DIELECTRIC AGING [J].
BAUMANN, T ;
FRUTH, B ;
STUCKI, F ;
ZELLER, HR .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (06) :1071-1076
[4]  
CANET P, 1989, 3RD P INT C COND BRE, P45
[5]   DIRECT MEASUREMENT OF SPACE-CHARGE INJECTION FROM A NEEDLE ELECTRODE INTO DIELECTRICS [J].
HIBMA, T ;
ZELLER, HR .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (05) :1614-1620
[6]   TEM OBSERVATION OF ELECTRICAL TREE PATHS AND MICROSTRUCTURES IN POLYETHYLENE [J].
HOZUMI, N ;
OKAMOTO, T ;
FUKAGAWA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1988, 27 (07) :1230-1233
[7]   IN PURSUIT OF BETTER ELECTRICAL INSULATING SOLID POLYMERS - PRESENT STATUS AND FUTURE-TRENDS [J].
IEDA, M .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1986, 21 (05) :793-802
[8]   THE INFLUENCE OF MORPHOLOGY ON THE ELECTRIC STRENGTH OF POLYMER INSULATION [J].
KOLESOV, SN .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1980, 15 (05) :382-388
[9]   MECHANISMS OF ELECTROLUMINESCENCE DURING AGING OF POLYETHYLENE [J].
LAURENT, C ;
MAYOUX, C ;
NOEL, S .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (11) :4346-4353
[10]  
Luff P. P., 1970, Thin Solid Films, V6, P175, DOI 10.1016/0040-6090(70)90038-6