ADSORBATE-GEOMETRY DETERMINATION BY MEASUREMENT AND ANALYSIS OF ANGLE-RESOLVED-PHOTOEMISSION EXTENDED-FINE-STRUCTURE DATA - APPLICATION TO C(2X2)S/NI(001)

被引:68
作者
BARTON, JJ
BAHR, CC
ROBEY, SW
HUSSAIN, Z
UMBACH, E
SHIRLEY, DA
机构
[1] STANFORD UNIV,STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305
[2] UNIV CALIF BERKELEY,DEPT CHEM,BERKELEY,CA 94720
[3] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720
来源
PHYSICAL REVIEW B | 1986年 / 34卷 / 06期
关键词
D O I
10.1103/PhysRevB.34.3807
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:3807 / 3819
页数:13
相关论文
共 30 条
[1]   DIRECT SURFACE-STRUCTURE DETERMINATION WITH PHOTOELECTRON DIFFRACTION [J].
BARTON, JJ ;
BAHR, CC ;
HUSSAIN, Z ;
ROBEY, SW ;
TOBIN, JG ;
KLEBANOFF, LE ;
SHIRLEY, DA .
PHYSICAL REVIEW LETTERS, 1983, 51 (04) :272-275
[2]   CURVED-WAVE-FRONT CORRECTIONS FOR PHOTOELECTRON SCATTERING [J].
BARTON, JJ ;
SHIRLEY, DA .
PHYSICAL REVIEW B, 1985, 32 (04) :1892-1905
[3]  
BARTON JJ, 1986, LBL19325 REP
[4]  
BARTON JJ, 1985, LBL14758 REP
[5]  
BARTON JJ, LBL19324 REP
[6]  
BARTON JJ, UNPUB PHYS REV B
[7]   STRUCTURE DETERMINATION OF C(2X2) S ON NI(100) USING POLARIZATION-DEPENDENT SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE [J].
BRENNAN, S ;
STOHR, J ;
JAEGER, R .
PHYSICAL REVIEW B, 1981, 24 (08) :4871-4874
[8]  
Brigham E. O., 1974, FAST FOURIER TRANSFO
[9]   ANALYSIS OF LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITY SPECTRA FOR (001), (110), AND (111) NICKEL [J].
DEMUTH, JE ;
MARCUS, PM ;
JEPSEN, DW .
PHYSICAL REVIEW B, 1975, 11 (04) :1460-1474
[10]   ELASTIC LEED INTENSITY ENERGY STUDIES OF CLEAN (001), (110) AND (111) NICKEL SURFACES [J].
DEMUTH, JE ;
RHODIN, TN .
SURFACE SCIENCE, 1974, 42 (01) :261-298