MODEL FOR THE DIAGNOSIS OF CIM EQUIPMENT

被引:1
作者
ALEXANDER, SM
VAIDYA, CM
GRAHAM, JH
机构
[1] UNIV LOUISVILLE,DEPT IND ENGN,LOUISVILLE,KY 40291
[2] UNIV LOUISVILLE,DEPT ENGN MATH & COMP SCI,LOUISVILLE,KY 40291
关键词
INTELLIGENT DIAGNOSTIC SYSTEMS; SENSOR VALIDATION SCHEMES; DIAGNOSTIC MODEL; SIMULATION;
D O I
10.1016/0045-7906(93)90045-S
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a model for the diagnosis of CIM (computer integrated manufacturing) equipment. The model uses the deep knowledge of state transitions in the manufacturing process, for fault isolation and determination of the causal agent. This requires the use of valid sensory information. The model utilizes a sensor validation approach which incorporates diagnostic expectation and exclusion techniques. Furthermore a generic mechanism classification is used to reduce the effort in encoding test procedures for each subsystem. The model is developed in details using a workcell with a SCARA robot performing pick-and-place operations. The implementation of the model is done using Intellicorp's Knowledge Engineering Environment on a Symbolics 3640 computer.
引用
收藏
页码:175 / 183
页数:9
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