A METHOD FOR THE DETERMINATION OF THE NOISE PARAMETERS IN PREAMPLIFYING SYSTEMS FOR SEMICONDUCTOR RADIATION DETECTORS

被引：114

作者：

BERTUCCIO, G

PULLIA, A

机构：

[1] Dipartimento di Elettronica e Informazione, Politecnico di Milano, 20133 Milano

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 11期

关键词：

D O I：

10.1063/1.1144293

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper a method for disentangling the various noise components in semiconductor radiation detector-amplifier systems is described and experimentally tested. A charge amplification scheme is adopted for the measurements. It is shown how an accurate estimate of the series and parallel white noise, 1/f series noise, and f parallel noise can be quickly obtained through a multiparameter least-squares interpolation of the equivalent noise charge data of the system.

引用

收藏

页码：3294 / 3298

页数：5

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