FLOW-INJECTION SYSTEM FOR STRIPPING VOLTAMMETRY

被引：46

作者：

WISE, JA

HEINEMAN, WR

KISSINGER, PT

机构：

[1] UNIV CINCINNATI,DEPT CHEM,CINCINNATI,OH 45221

[2] PURDUE UNIV,DEPT CHEM,W LAFAYETTE,IN 47907

来源：

ANALYTICA CHIMICA ACTA | 1985年 / 172卷 / JUN期

关键词：

D O I：

10.1016/S0003-2670(00)82588-X

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1 / 12

页数：12

共 12 条

[1] THIN-LAYER DIFFERENTIAL PULSE VOLTAMMETRY [J].

DEANGELIS, TP ;

BOND, RE ;

BROOKS, EE ;

HEINEMAN, WR .

ANALYTICAL CHEMISTRY, 1977, 49 (12) :1792-1797

[2] DIFFERENTIAL PULSE ANODIC-STRIPPING VOLTAMMETRY IN A THIN-LAYER ELECTROCHEMICAL CELL [J].

DEANGELIS, TP ;

HEINEMAN, WR .

ANALYTICAL CHEMISTRY, 1976, 48 (14) :2262-2263

[3] HETEROGENEOUS IMMUNOASSAY FOR SERUM-PROTEINS BY DIFFERENTIAL PULSE ANODIC-STRIPPING VOLTAMMETRY [J].

DOYLE, MJ ;

HALSALL, HB ;

HEINEMAN, WR .

ANALYTICAL CHEMISTRY, 1982, 54 (13) :2318-2322

[4] MERCURY FILM NICKEL MINI-GRID OPTICALLY TRANSPARENT THIN-LAYER ELECTROCHEMICAL CELL [J].

HEINEMAN, WR ;

DEANGELIS, TP ;

GOELZ, JF .

ANALYTICAL CHEMISTRY, 1975, 47 (08) :1364-1369

[5]

MORRELL G, 1976, CLIN CHEM, V22, P221

[6]

Osteryoung J., 1976, REV POLAROGR KYOTO, V22, P1

[7] MICROPROCESSOR-CONTROLLED POTENTIOSTAT FOR TWIN-ELECTRODE VOLTAMMETRY [J].

PAUL, DW ;

RIDGWAY, TH ;

HEINEMAN, WR .

ANALYTICA CHIMICA ACTA, 1983, 146 (FEB) :125-134

[8]

PAUL DW, 1980, THESIS U CINCINNATI

[9] ELIMINATION OF INTERMETALLIC COMPOUND INTERFERENCES IN TWIN-ELECTRODE THIN-LAYER ANODIC-STRIPPING VOLTAMMETRY [J].

ROSTON, DA ;

BROOKS, EE ;

HEINEMAN, WR .

ANALYTICAL CHEMISTRY, 1979, 51 (11) :1728-1732

[10]

SEARLE B, 1973, CLIN CHEM, V19, P76

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