CHARGE MIGRATION CONTRIBUTION TO THE SENSITIVE LAYER OF A SILICON DETECTOR

被引:15
作者
CROITORU, N [1 ]
RANCOITA, PG [1 ]
SEIDMAN, A [1 ]
机构
[1] CERN,CH-1211 GENEVA 23,SWITZERLAND
关键词
D O I
10.1016/0168-9002(85)90989-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:443 / 450
页数:8
相关论文
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