HIGH-RESOLUTION ELECTRON-MICROSCOPY ON EPITAXIAL PB(MG1/3NB2/3)O3 FILM PREPARED BY SOL-GEL METHOD

被引：14

作者：

OKUWADA, K ^{[1
]}

NAKAMURA, S ^{[1
]}

IMAI, M ^{[1
]}

KAKUNO, K ^{[1
]}

机构：

[1] YOKOHAMA NATL UNIV, FAC ENGN, DEPT ELECT & COMP ENGN, HODOGAYA KU, YOKOHAMA, KANAGAWA 240, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1991年 / 30卷 / 6A期

关键词：

FERROELECTRIC MATERIAL; PEROVSKITE STRUCTURE; MICROSTRUCTURE; ELECTRON DIFFRACTION; X-RAY DIFFRACTION; EPITAXIAL GROWTH; LATTICE MATCHING; SUPERLATTICE; SHORT-RANGE ORDER;

D O I：

10.1143/JJAP.30.L1052

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Highly oriented Pb(Mg1/3Nb2/3)O3 films prepared by the sol-gel method were studied with high resolution electron microscopy. The lattice image reveals epitaxial growth at the interface between the perovskite crystal and MgO single crystal substrate. A short-range ordered structure is ascertained to exist in the pervoskite grains in the film.

引用

页码：L1052 / L1055

页数：4

共 9 条

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