THE MAXIMUM-ENTROPY METHOD IN CHARGE-DENSITY STUDIES - ASPECTS OF RELIABILITY

The maximum-entropy method (MEM) was applied to accurate gamma-ray diffraction data from MnF2 and NiF2 to explore details of the charge-density distribution. For a fair judgement of the results, Si Pendellosung data [Saka & Kato (1986). Acta Cryst. A42, 469-478] were also treated. It is shown that conclusions drawn from MEM maps must be accepted with some reserve, particularly in the regions of interest in charge-density studies.