EFFECT OF PREFERRED ORIENTATION ON INTENSITY DISTRIBUTION OF (HK) INTERFERENCES

被引：77

作者：

RULAND, W

TOMPA, H

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY | 1968年 / A 24卷

关键词：

D O I：

10.1107/S0567739468000112

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

[No abstract available]

引用

页码：93 / &

共 11 条

[1] DIFFRACTIONS DES RAYONS X PAR LES STRUCTURES EN COUCHES DESORDONNEES .1. [J].

BRINDLEY, GW ;

MERING, J .

ACTA CRYSTALLOGRAPHICA, 1951, 4 (05) :441-447

[2]

CARSLAW HS, 1930, INTRODUCTION THEORY, P250

[3]

DUSCHEK A, 1961, VORLESUNGEN UBER HOH, P47

[4] PREFERRED ORIENTATION AND ITS EFFECT ON THE (HK) REFLECTIONS IN X-RAY PATTERNS OF PYROLYTIC GRAPHITES [J].

GUENTERT, OJ ;

CVIKEVICH, S .

CARBON, 1964, 1 (03) :309-313

[5]

MARGENAU H, 1956, MATHEMATICS PHYSICS, P286

[6] FOURIER TRANSFORM METHODS FOR RANDOM-LAYER LINE PROFILES [J].

RULAND, W .

ACTA CRYSTALLOGRAPHICA, 1967, 22 :615-&

[7]

RULAND W, IN PRESS

[8] X-ray diffraction in random layer lattices [J].

Warren, BE .

PHYSICAL REVIEW, 1941, 59 (09) :693-698

[9] SHAPE OF 2-DIMENSIONAL CARBON BLACK REFLECTIONS [J].

WARREN, BE ;

BODENSTEIN, P .

ACTA CRYSTALLOGRAPHICA, 1966, 20 :602-+

[10] X-RAY DIFFRACTION BY RANDOM LAYERS - IDEAL LINE PROFILES AND DETERMINATION OF STRUCTURE AMPLITUDES FROM OBSERVED LINE PROFILES [J].

WILSON, AJC .

ACTA CRYSTALLOGRAPHICA, 1949, 2 (04) :245-251

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