DETERMINATION OF SILICON DIOXIDE IN SILICON-CARBIDE BY DIFFUSE REFLECTANCE INFRARED FOURIER-TRANSFORM SPECTROMETRY

Diffuse reflectance infrared Fourier transform spectrometry was applied to the determination of SiO//2 in SiC powders. The main peaks of SiO//2 were observed in the 1000-1250 cm** minus **1 region. The peak intensities were estimated from the peak height at 1150 cm** minus **1. The intensities were little affected by the particle sizes of SiC powders in the 1-9- mu m region. The linear relationship between peak intensity and concentration was obtained in the concentration range of 0-5 wt% SiO//2. The analytical curve was successfully used for the determination of SiO//2 in a few commercial SiC powders.