SCANNING PROBE MICROSCOPY STUDY OF THE INCOMMENSURATE MODULATION AND SURFACE-DEFECTS IN THE LAYERED TELLURIDE TAGE0.355TE2

被引：15

作者：

BENGEL, H

CANTOW, HJ

MAGONOV, SN

MONCONDUIT, L

EVAIN, M

LIANG, WG

WHANGBO, MH

机构：

[1] UNIV NANTES,CNRS,UMR 110,INST MAT NANTES,CHIM SOLIDES LAB,F-44072 NANTES,FRANCE

[2] N CAROLINA STATE UNIV,DEPT CHEM,RALEIGH,NC 27695

来源：

ADVANCED MATERIALS | 1994年 / 6卷 / 09期

关键词：

D O I：

10.1002/adma.19940060905

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The detection of atomic-size defects by atomic force microscopy (AFM) is demonstrated. For example, the dark grooves in the image of the surface of the incommensurate layered telluride phase TaGe0.355Te2 (see Figure) indicate a defect. The origin of this incommensurate structure of layered tellurides is established and it is shown that high applied forces enhance the image contrast in AFM.

引用

页码：649 / 654

页数：6

共 24 条

[1] IMAGING MOLECULAR DEFECTS IN ALKANETHIOL MONOLAYERS WITH AN ATOMIC-FORCE MICROSCOPE [J].