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CHARGING EFFECT IN X-RAY PHOTOELECTRON SPECTROMETRY
被引:63
作者
:
EBEL, MF
论文数:
0
引用数:
0
h-index:
0
机构:
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
EBEL, MF
[
1
]
EBEL, H
论文数:
0
引用数:
0
h-index:
0
机构:
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
EBEL, H
[
1
]
机构
:
[1]
TH VIENNA,INST TECH PHYS,KARLSPLATZ 13,A-1040 VIENNA,AUSTRIA
来源
:
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
|
1974年
/ 3卷
/ 03期
关键词
:
D O I
:
10.1016/0368-2048(74)80008-3
中图分类号
:
O433 [光谱学];
学科分类号
:
0703 ;
070302 ;
摘要
:
引用
收藏
页码:169 / 180
页数:12
相关论文
共 4 条
[1]
EXTERNAL STANDARDS IN X-RAY PHOTOELECTRON SPECTROSCOPY - COMPARISON OF GOLD, CARBON, AND MOLYBDENUM TRIOXIDE
DIANIS, WP
论文数:
0
引用数:
0
h-index:
0
机构:
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
DIANIS, WP
LESTER, JE
论文数:
0
引用数:
0
h-index:
0
机构:
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
LESTER, JE
[J].
ANALYTICAL CHEMISTRY,
1973,
45
(08)
: 1416
-
1420
[2]
Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]
[3]
DETERMINATION OF CHARGING EFFECT IN PHOTOELECTRON SPECTROSCOPY OF NONCONDUCTING SOLIDS
HNATOWICH, DJ
论文数:
0
引用数:
0
h-index:
0
HNATOWICH, DJ
HUDIS, J
论文数:
0
引用数:
0
h-index:
0
HUDIS, J
PERLMAN, ML
论文数:
0
引用数:
0
h-index:
0
PERLMAN, ML
RAGAINI, RC
论文数:
0
引用数:
0
h-index:
0
RAGAINI, RC
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(12)
: 4883
-
+
[4]
Reimer L., 1973, RASTERELEKTRONENMIKR
←
1
→
共 4 条
[1]
EXTERNAL STANDARDS IN X-RAY PHOTOELECTRON SPECTROSCOPY - COMPARISON OF GOLD, CARBON, AND MOLYBDENUM TRIOXIDE
DIANIS, WP
论文数:
0
引用数:
0
h-index:
0
机构:
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
DIANIS, WP
LESTER, JE
论文数:
0
引用数:
0
h-index:
0
机构:
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
NORTHWESTERN UNIV,DEPT CHEM,EVANSTON,IL 60201
LESTER, JE
[J].
ANALYTICAL CHEMISTRY,
1973,
45
(08)
: 1416
-
1420
[2]
Hedman J., 1972, PHYS SCRIPTA, V5, P93, DOI [10.1088/0031-8949/5/1-2/015, DOI 10.1088/0031-8949/5/1-2/015]
[3]
DETERMINATION OF CHARGING EFFECT IN PHOTOELECTRON SPECTROSCOPY OF NONCONDUCTING SOLIDS
HNATOWICH, DJ
论文数:
0
引用数:
0
h-index:
0
HNATOWICH, DJ
HUDIS, J
论文数:
0
引用数:
0
h-index:
0
HUDIS, J
PERLMAN, ML
论文数:
0
引用数:
0
h-index:
0
PERLMAN, ML
RAGAINI, RC
论文数:
0
引用数:
0
h-index:
0
RAGAINI, RC
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(12)
: 4883
-
+
[4]
Reimer L., 1973, RASTERELEKTRONENMIKR
←
1
→