INCREMENTS AT INTERFACE BETWEEN LAYERS DURING INFRARED FILTER MANUFACTURE

被引：4

作者：

EVANS, CS ^{[1
]}

HUNNEMAN, R ^{[1
]}

SEELEY, JS ^{[1
]}

机构：

[1] UNIV READING,DEPT ENGN & CYBERNETICS,READING,ENGLAND

来源：

OPTICA ACTA | 1976年 / 23卷 / 04期

关键词：

D O I：

10.1080/713819255

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：297 / 303

页数：7

共 11 条

[1]

Evans C. S., 1968, Journal de Physique, V29, pc4, DOI 10.1051/jphyscol:1968405

[2]

EVANS CD, IN PRESS

[3] HIGH-PERFORMANCE MULTILAYER INTERFERENCE FILTERS FOR REGION 12-50 UM [J].

EVANS, CS ;

HUNNEMAN, R ;

SEELEY, JS .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (02) :309-320

[4] OPTICAL THICKNESS CHANGES IN FRESHLY DEPOSITED LAYERS OF LEAD-TELLURIDE [J].

EVANS, CS ;

HUNNEMAN, R ;

SEELEY, JS .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (02) :321-328

[5]

EVANS CS, 1971, 22 IERE C, P123

[6] ABSORPTION IN TURNING VALUE MONITORING OF NARROW-BAND THIN-FILM OPTICAL FILTERS [J].

MACLEOD, HA .

OPTICA ACTA, 1973, 20 (07) :493-508

[7] TURNING VALUE MONITORING OF NARROW-BAND ALL-DIELECTRIC THIN-FILM OPTICAL FILTERS [J].

MACLEOD, HA .

OPTICA ACTA, 1972, 19 (01) :1-&

[8]

SEELEY JS, 1972, Patent No. 1425941

[9]

SMITH SD, 1968, USAF61052833 CONTR

[10]

SMITH SD, 1972, INFRARED DETECTION T, P199

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