DOUBLE-BEAM INTERNAL REFLECTION SPECTROMETER

[1] ATTENUATED TOTAL REFLECTION - A NEW PRINCIPLE FOR THE PRODUCTION OF USEFUL INFRA-RED REFLECTION SPECTRA OF ORGANIC COMPOUNDS [J]. SPECTROCHIMICA ACTA, 1961, 17 (07): : 698 - +

[2] ON THE DETERMINATION OF OPTICAL CONSTANTS IN THE INFRARED BY ATTENUATED TOTAL REFLECTION [J]. SPECTROCHIMICA ACTA, 1962, 18 (09): : 1103 - &

[3] FAHRENFORT J, PRIVATE COMMUNICATIO

[4] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW, 1962, 125 (04): : 1165 - &

[5] VERTICAL DOUBLE-PASS MULTIPLE REFLECTION ELEMENT FOR INTERNAL REFLECTION SPECTROSCOPY [J]. APPLIED OPTICS, 1966, 5 (01): : 1 - &

[6] STUDY OF PHYSICS AND CHEMISTRY OF SURFACES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW LETTERS, 1960, 4 (05) : 224 - 226

[1] ATTENUATED TOTAL REFLECTION - A NEW PRINCIPLE FOR THE PRODUCTION OF USEFUL INFRA-RED REFLECTION SPECTRA OF ORGANIC COMPOUNDS [J]. SPECTROCHIMICA ACTA, 1961, 17 (07): : 698 - +

[2] ON THE DETERMINATION OF OPTICAL CONSTANTS IN THE INFRARED BY ATTENUATED TOTAL REFLECTION [J]. SPECTROCHIMICA ACTA, 1962, 18 (09): : 1103 - &

[3] FAHRENFORT J, PRIVATE COMMUNICATIO

[4] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW, 1962, 125 (04): : 1165 - &

[5] VERTICAL DOUBLE-PASS MULTIPLE REFLECTION ELEMENT FOR INTERNAL REFLECTION SPECTROSCOPY [J]. APPLIED OPTICS, 1966, 5 (01): : 1 - &

[6] STUDY OF PHYSICS AND CHEMISTRY OF SURFACES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J]. PHYSICAL REVIEW LETTERS, 1960, 4 (05) : 224 - 226