PLASMA DESORPTION MASS-SPECTROMETRY (PDMS) - LIMITATIONS AND POSSIBILITIES

被引:36
作者
SUNDQVIST, B
HEDIN, A
HAKANSSON, P
KAMENSKY, I
SALEHPOUR, M
SAWE, G
机构
来源
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1985年 / 65卷 / 1-2期
关键词
D O I
10.1016/0168-1176(85)85054-0
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
引用
收藏
页码:69 / 89
页数:21
相关论文
共 39 条
[1]   MODEL OF SECONDARY-ELECTRON YIELDS FROM ATOMIC AND POLYATOMIC ION IMPACTS ON COPPER AND TUNGSTEN SURFACES BASED UPON STOPPING-POWER CALCULATIONS [J].
BEUHLER, RJ ;
FRIEDMAN, L .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (09) :3928-3936
[2]   THRESHOLD STUDIES OF SECONDARY-ELECTRON EMISSION INDUCED BY MACRO-ION IMPACT ON SOLID-SURFACES [J].
BEUHLER, RJ ;
FRIEDMAN, L .
NUCLEAR INSTRUMENTS & METHODS, 1980, 170 (1-3) :309-315
[3]   LOW-NOISE, HIGH-VOLTAGE SECONDARY-EMISSION ION DETECTOR FOR POLYATOMIC IONS [J].
BEUHLER, RJ ;
FRIEDMAN, L .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1977, 23 (02) :81-97
[4]  
BURLINGAME AL, 1984, ANAL CHEM, V56, pR417
[5]   A TIME-OF-FLIGHT MASS-SPECTROMETER FOR MEASUREMENT OF SECONDARY ION MASS-SPECTRA [J].
CHAIT, BT ;
STANDING, KG .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 40 (02) :185-193
[6]   FISSION FRAGMENT IONIZATION (CF-252) MASS-SPECTROMETRY - POSITIVE AND NEGATIVE SPECTRA AND DECOMPOSITION MECHANISMS FOR SEVEN COMPOUNDS [J].
CHAIT, BT ;
AGOSTA, WC ;
FIELD, FH .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 39 (03) :339-366
[7]  
CHAIT BT, 1984, 32ND ANN C MASS SPEC
[8]   A REVIEW OF THE APPLICATIONS TO SOLIDS OF THE LASER ION-SOURCE IN MASS-SPECTROMETRY [J].
CONZEMIUS, RJ ;
CAPELLEN, JM .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4) :197-271
[9]   LASERS AND MASS-SPECTROMETRY [J].
COTTER, RJ .
ANALYTICAL CHEMISTRY, 1984, 56 (03) :A485-&
[10]   LASER DESORPTION MASS-SPECTROMETRY - MECHANISMS AND APPLICATIONS [J].
COTTER, RJ ;
TABET, JC .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 53 (SEP) :151-166