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FORMATION AND ELIMINATION OF SURFACE ION MILLING DEFECTS IN CADMIUM TELLURIDE, ZINC-SULFIDE AND ZINC SELENIDE
被引:72
作者
:
CULLIS, AG
论文数:
0
引用数:
0
h-index:
0
机构:
Royal Signals & Radar, Establishment, Malvern, Engl, Royal Signals & Radar Establishment, Malvern, Engl
CULLIS, AG
CHEW, NG
论文数:
0
引用数:
0
h-index:
0
机构:
Royal Signals & Radar, Establishment, Malvern, Engl, Royal Signals & Radar Establishment, Malvern, Engl
CHEW, NG
HUTCHISON, JL
论文数:
0
引用数:
0
h-index:
0
机构:
Royal Signals & Radar, Establishment, Malvern, Engl, Royal Signals & Radar Establishment, Malvern, Engl
HUTCHISON, JL
机构
:
[1]
Royal Signals & Radar, Establishment, Malvern, Engl, Royal Signals & Radar Establishment, Malvern, Engl
来源
:
ULTRAMICROSCOPY
|
1985年
/ 17卷
/ 03期
关键词
:
DEFECTS FORMATION - DISLOCATION LOOPS - SURFACE ION MILLING;
D O I
:
10.1016/0304-3991(85)90087-7
中图分类号
:
TH742 [显微镜];
学科分类号
:
摘要
:
引用
收藏
页码:203 / 211
页数:9
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GRIFFITH UNIV,SCH SCI,NATHAN,QLD 4111,AUSTRALIA
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SEGALL, RL
[J].
JOURNAL OF MATERIALS SCIENCE,
1983,
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-
1425
[2]
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1984,
44
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: 142
-
144
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NG, TL
[J].
JOURNAL OF MATERIALS SCIENCE,
1984,
19
(11)
: 3726
-
3731
[6]
COMPARATIVE-STUDY OF ANNEALED NEON-ION, ARGON-ION, AND KRYPTON-ION IMPLANTATION DAMAGE IN SILICON
CULLIS, AG
论文数:
0
引用数:
0
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0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
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SEIDEL, TE
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BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SEIDEL, TE
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0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MEEK, RL
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(10)
: 5188
-
5198
[7]
CULLIS AG, 1985, I PHYS C SER, V76, P29
[8]
HUTCHISON JL, 1982, I PHYS C SER, V61, P357
[9]
HUTCHISON JL, J MICROSCOPY
[10]
THE STRUCTURE AND OPTICAL-PROPERTIES OF POLYCRYSTALLINE ZNSXSE1-X PREPARED BY CHEMICAL VAPOR-DEPOSITION
LEWIS, KL
论文数:
0
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COOK, DJ
论文数:
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h-index:
0
COOK, DJ
ROSCOE, PB
论文数:
0
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[J].
JOURNAL OF CRYSTAL GROWTH,
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56
(03)
: 614
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620
←
1
2
→