RFLP ANALYSIS OF AN AEGILOPS VENTRICOSA CHROMOSOME THAT CARRIES A GENE CONFERRING RESISTANCE TO LEAF RUST (PUCCINIA-RECONDITA) WHEN TRANSFERRED TO HEXAPLOID WHEAT

被引:28
作者
BONHOMME, A
GALE, MD
KOEBNER, RMD
NICOLAS, P
JAHIER, J
BERNARD, M
机构
[1] JOHN INNES CTR PLANT SCI RES,CAMBRIDGE LAB,NORWICH NR4 7UJ,NORFOLK,ENGLAND
[2] UNIV CLERMONT FERRAND,F-63000 CLERMONT FERRAND,FRANCE
[3] INRA,AMELIORAT PLANTES STN,F-35650 LE RHEU,FRANCE
关键词
RFLP ANALYSIS; WHEAT; AEGILOPS VENTRICOSA; LEAF RUST RESISTANCE;
D O I
10.1007/BF00222919
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
RFLP analysis has been used to characterise XM(v), a chromosome of Aegilops ventricosa present in a disomic addition line of wheat. This chromosome is known to carry a major gene conferring resistance to leaf rust (Lr). The analysis demonstrated that XM(v) is translocated with respect to the standard wheat genome, and consists of a segment of the short arm of homoeologous group 2 attached to a group 6 chromosome lacking a distal part of the short arm. Lr was located to the region of XM(v) with homoeology to 2S by analysis of a leaf rust-susceptible deletion line that was found to lack the entire 2S segment. Confirmation and refinement of the location of Lr was obtained by analysis of a spontaneous resistant translocation in which a small part of XM(v) had been transferred to wheat chromosome 2A.
引用
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页码:1042 / 1048
页数:7
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