MEASUREMENT ON POSITIVE-PERMITTIVITY METAL-CLAD WAVEGUIDES

被引：5

作者：

BATCHMAN, TE ^{[1
]}

MCMILLAN, KA ^{[1
]}

机构：

[1] UNIV QUEENSLAND, BRISBANE 4000, Qld, AUSTRALIA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1977年 / 13卷 / 04期

关键词：

D O I：

10.1109/JQE.1977.1069300

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：187 / 192

页数：6

共 21 条

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[8]

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[10] 4-LAYER METAL-CLAD THIN-FILM OPTICAL-WAVEGUIDES [J].

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