X-RAY REFLECTIVITY OF A POLYMER MONOLAYER AT THE WATER-VAPOR INTERFACE

被引:18
作者
SCHLOSSMAN, ML
SCHWARTZ, DK
KAWAMOTO, EH
KELLOGG, GJ
PERSHAN, PS
KIM, MW
CHUNG, TC
机构
[1] HARVARD UNIV,DIV APPL SCI,CAMBRIDGE,MA 02138
[2] HARVARD UNIV,DEPT PHYS,CAMBRIDGE,MA 02138
[3] EXXON RES & ENGN CO,CORP RES SCI LABS,ANNANDALE,NJ 08801
[4] PENN STATE UNIV,DEPT MAT SCI & ENGN,UNIVERSITY PK,PA 16802
关键词
D O I
10.1021/j100170a046
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
X-ray specular reflectivity from a monolayer of partially hydroxylated 1,2-polybutadiene (50% butyl alcohol random substitution) at the water/vapor interface was measured from below the critical wavevector for water, 0.0217 angstrom-1, to Q(z) approximately-equal-to 0.6 angstrom-1 (where Q(z) is the transferred momentum normal to the interface). The sample was prepared on a Langmuir trough, and measurements were made at five different surface densities in the high-pressure, or saturated, region of the isotherm. The measured reflectivity is interpreted to obtain a profile of the average electron density rho(z) as a function of distance z along the surface normal. The profile has a local maximum that is approximately 10% larger than the electron density in bulk crystalline 1,2-polybutadiene. At the highest pressures the width of the liquid/vapor interface is approximately 10% larger than the value calculated from thermal capillary waves using in situ measurements of the surface tension; however, for smaller pressures the measured and calculated values agree.
引用
收藏
页码:6628 / 6632
页数:5
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