SURFACE IMPEDANCE MEASUREMENTS OF SUPERCONDUCTING V3SI FILMS BY A MICROSTRIP RESONATOR TECHNIQUE

被引:9
作者
ANDREONE, A [1 ]
CASSINESE, A [1 ]
DICHIARA, A [1 ]
SALLUZZO, M [1 ]
VAGLIO, R [1 ]
ATTANASIO, C [1 ]
MARITATO, L [1 ]
机构
[1] UNIV SALERNO,DIPARTIMENTO FIS,I-84081 BARONISSI,ITALY
关键词
D O I
10.1063/1.360220
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using a ring microstrip resonator technique, the surface impedance of V3Si sputtered films has been measured as a function of temperature and de and rf field amplitude. The results are analyzed in terms of the Bardeen-Cooper-Schrieffer theory and of a grain-boundary Josephson model, and discussed in the framework of the possible application of V3Si as a thin-film coating of superconducting rf cavities for particle accelerators. (C) 1995 American Institute of Physics.
引用
收藏
页码:1862 / 1865
页数:4
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