COMPARISON OF THE NOISE OF DIFFERENT ELECTRON DETECTION SYSTEMS USING A SCINTILLATOR-PHOTOMULTIPLIER COMBINATION

被引：43

作者：

BAUMANN, W

REIMER, L

机构：

来源：

关键词：

D O I：

10.1002/sca.4950040304

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：141 / 151

页数：11

共 23 条

[1] BAUMANN W, 1981, J MICROSCOPY
[2] Baumann W., 1980, ELECTRON MICROS, V1980, P174
[3] Breitenberger E., 1955, PROGR NUCL PHYS, V4, P56
[4] Evekhart T.E., 1959, J ELECT CONTROL, V7, P97, DOI 10.1080/00207215908937191
[5] WIDE-BAND DETECTOR FOR MICRO-MICROAMPERE LOW-ENERGY ELECTRON CURRENTS
EVERHART, TE
THORNLEY, RFM
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (07): : 246 - 248
[6] EVRARD PR, 1965, J PHYSIQUE, V26, pA37
[7] Shot effect of secondary electrons from nickel and beryllium
Kurrelmeyer, B
Hayner, LJ
[J]. PHYSICAL REVIEW, 1937, 52 (09): : 0952 - 0958
[8] MOLL SH, 1979, SCANNING ELECTRON MI, V1, P149
[9] MOLL SH, 1978, SCANNING ELECTRON MI, V2, P303
[10] Pawley J. B., 1974, Scanning Electron Microscopy 1974, P27