EXCESS NOISE AS AN INDICATOR OF DIGITAL INTEGRATED-CIRCUIT RELIABILITY

被引：10

作者：

JONES, BK

XU, YZ

机构：

[1] Department of Physics, University of Lancaster, Lancaster

来源：

MICROELECTRONICS AND RELIABILITY | 1991年 / 31卷 / 2-3期

关键词：

D O I：

10.1016/0026-2714(91)90220-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Excess noise measurements have been performed on CMOS logic integrated circuits. The noise has been observed in the power supply leakage current with no gates switching and in the dynamic power supply current when gates are switched. The presence and size of the noise has been shown to be a sensitive indicator of the quality and hence reliability of the device.

引用

页码：351 / 361

页数：11

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