CONTROL OF TEMPERATURE IN THIN SAMPLES DURING ION-BEAM ANALYSIS

被引：30

作者：

CAHILL, TA ^{[1
]}

MCCOLM, DW ^{[1
]}

KUSKO, BH ^{[1
]}

机构：

[1] UNIV CALIF DAVIS,CROCKER NUCL LAB,DAVIS,CA 95616

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 14卷 / 01期

关键词：

ION BEAMS - TEMPERATURE CONTROL;

D O I：

10.1016/0168-583X(86)90420-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The ability of ion beam analytical techniques such as proton induced X-ray emission (PIXE) to determine elemental content without damaging fragile objects is a key factor in their increasing use in the analysis of art and archaeological objects. In this paper, we calculate the expected temperature rise in thin, planar samples with and without radiative, conductive, and convective cooling. The results show that the primary emphasis must be placed on minimizing energy input to the sample, and that forced convective cooling is by far the most effective method of energy removal in materials such as paper, parchment, and fabrics.

引用

页码：38 / 44

页数：7

共 8 条

[1] GUTENBERG INKS AND PAPERS - NON-DESTRUCTIVE COMPOSITIONAL ANALYSES BY PROTON MILLIPROBE [J].