X-RAY-DIFFRACTION STUDY OF SOLID HYDROGEN-SULFIDE UNDER HIGH-PRESSURE

被引：31

作者：

ENDO, S

ICHIMIYA, N

KOTO, K

SASAKI, S

SHIMIZU, H

机构：

[1] UNIV TOKUSHIMA,FAC INTEGRATED ARTS & SCI,TOKUSHIMA 770,JAPAN

[2] GIFU UNIV,DEPT ELECTR & COMP ENGN,GIFU 50111,JAPAN

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.50.5865

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Solid H2S was studied by x-ray diffraction under pressure up to 20 GPa at room temperature. An F --> P symmetry change in the cubic lattice was observed at 8 GPa. At 11 GPa where a previous Raman study indicated a pressure-induced transition, an obvious crystal structure change from the cubic symmetry to a lower symmetry was observed.

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页码：5865 / 5867

页数：3

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