REPEATED INTENSITY MEASUREMENTS FOR X-RAY-FLUORESCENCE ANALYSIS OF THIN SAMPLES AND EVALUATION OF A SCATTERED LINE AS AN INTERNAL STANDARD

被引：4

作者：

IWATSUKI, M

ITO, M

SHIMIZU, H

ENDO, M

FUKASAWA, T

机构：

来源：

X-RAY SPECTROMETRY | 1989年 / 18卷 / 01期

关键词：

D O I：

10.1002/xrs.1300180109

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

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页码：35 / 38

页数：4

相关论文

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[2] STATISTICAL FACTORS IN X-RAY INTENSITY MEASUREMENTS [J].

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SPIELBERG, N .

SPECTROCHIMICA ACTA, 1958, 12 (2-3) :169-178

[3]

SPIELBERG N, 1963, APPL SPECTROSC, V17, P6

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TERTIAN R, 1982, PRINCIPLES QUANTITAT, P334