A TEST STATISTIC FOR THE AFFECTED-SIB-SET METHOD

被引：53

作者：

LANGE, K

机构：

来源：

关键词：

D O I：

10.1111/j.1469-1809.1986.tb01049.x

中图分类号：

Q3 [遗传学];

学科分类号：

071007 ; 090102 ;

摘要：

引用

页码：283 / 290

页数：8

共 17 条

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