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ON RELATIONSHIP BETWEEN PHOTOCURRENT DECAY TIME AND TRAP DISTRIBUTION IN CDS AND CDSE PHOTOCONDUCTORS

被引：30
作者：
SKARMAN, JS
机构：
来源：
SOLID-STATE ELECTRONICS | 1965年 / 8卷 / 01期
关键词：
D O I：
10.1016/0038-1101(65)90005-5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：17 / &
相关论文
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