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POTENTIAL OF CCDS FOR UV AND X-RAY PLASMA DIAGNOSTICS
被引:27
作者
:
JANESICK, JR
论文数:
0
引用数:
0
h-index:
0
机构:
TEKTRONIX INC,BEAVERTON,OR 97077
TEKTRONIX INC,BEAVERTON,OR 97077
JANESICK, JR
[
1
]
ELLIOTT, T
论文数:
0
引用数:
0
h-index:
0
机构:
TEKTRONIX INC,BEAVERTON,OR 97077
TEKTRONIX INC,BEAVERTON,OR 97077
ELLIOTT, T
[
1
]
MARSH, HH
论文数:
0
引用数:
0
h-index:
0
机构:
TEKTRONIX INC,BEAVERTON,OR 97077
TEKTRONIX INC,BEAVERTON,OR 97077
MARSH, HH
[
1
]
COLLINS, S
论文数:
0
引用数:
0
h-index:
0
机构:
TEKTRONIX INC,BEAVERTON,OR 97077
TEKTRONIX INC,BEAVERTON,OR 97077
COLLINS, S
[
1
]
MCCARTHY, JK
论文数:
0
引用数:
0
h-index:
0
机构:
TEKTRONIX INC,BEAVERTON,OR 97077
TEKTRONIX INC,BEAVERTON,OR 97077
MCCARTHY, JK
[
1
]
BLOUKE, MM
论文数:
0
引用数:
0
h-index:
0
机构:
TEKTRONIX INC,BEAVERTON,OR 97077
TEKTRONIX INC,BEAVERTON,OR 97077
BLOUKE, MM
[
1
]
机构
:
[1]
TEKTRONIX INC,BEAVERTON,OR 97077
来源
:
REVIEW OF SCIENTIFIC INSTRUMENTS
|
1985年
/ 56卷
/ 05期
关键词
:
D O I
:
10.1063/1.1138176
中图分类号
:
TH7 [仪器、仪表];
学科分类号
:
0804 ;
080401 ;
081102 ;
摘要
:
引用
收藏
页码:796 / 801
页数:6
相关论文
共 7 条
[1]
800X800 CHARGE-COUPLED DEVICE IMAGE SENSOR
BLOUKE, MM
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
BLOUKE, MM
JANESICK, JR
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
JANESICK, JR
HALL, JE
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
HALL, JE
COWENS, MW
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
COWENS, MW
MAY, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
MAY, PJ
[J].
OPTICAL ENGINEERING,
1983,
22
(05)
: 607
-
614
[2]
DEAL BE, 1974, J ELECTROCHEM SOC, V121, P198
[3]
JANESICK J, 1984, 1984 IEEE NUCL SCI S
[4]
JANESICK J, 1984, SPIE, V501
[5]
JANESICK J, 1985, AUG SPIE C
[6]
NONDISPERSIVE X-RAY SPECTROSCOPY AND IMAGING OF PLASMAS USING A CHARGE-COUPLED DEVICE
MARSH, K
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
MARSH, K
JOSHI, C
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
JOSHI, C
JANESICK, J
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
JANESICK, J
COLLINS, S
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
COLLINS, S
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1985,
56
(05)
: 837
-
839
[7]
MARSH K, 1984, MAY IEEE INT C PLASM
←
1
→
共 7 条
[1]
800X800 CHARGE-COUPLED DEVICE IMAGE SENSOR
BLOUKE, MM
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
BLOUKE, MM
JANESICK, JR
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
JANESICK, JR
HALL, JE
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
HALL, JE
COWENS, MW
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
COWENS, MW
MAY, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, CCD IMAGERS & CAMERA PROJECT, DALLAS, TX 75265 USA
MAY, PJ
[J].
OPTICAL ENGINEERING,
1983,
22
(05)
: 607
-
614
[2]
DEAL BE, 1974, J ELECTROCHEM SOC, V121, P198
[3]
JANESICK J, 1984, 1984 IEEE NUCL SCI S
[4]
JANESICK J, 1984, SPIE, V501
[5]
JANESICK J, 1985, AUG SPIE C
[6]
NONDISPERSIVE X-RAY SPECTROSCOPY AND IMAGING OF PLASMAS USING A CHARGE-COUPLED DEVICE
MARSH, K
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
MARSH, K
JOSHI, C
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
JOSHI, C
JANESICK, J
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
JANESICK, J
COLLINS, S
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91109
CALTECH,JET PROP LAB,PASADENA,CA 91109
COLLINS, S
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1985,
56
(05)
: 837
-
839
[7]
MARSH K, 1984, MAY IEEE INT C PLASM
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1
→