THROUGH-THICKNESS MARK LENGTH VARIATIONS IN LASER-IRRADIATED THIN-FILMS

被引：3

作者：

BARTHOLOMEUSZ, B ^{[1
]}

OLIN, G ^{[1
]}

机构：

[1] EASTMAN KODAK CO,DIV MASS MEMORY,OPT RECORDING MAT LAB,ROCHESTER,NY 14650

来源：

OPTICAL ENGINEERING | 1990年 / 29卷 / 08期

关键词：

D O I：

10.1117/12.55665

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：988 / 992

页数：5

共 12 条

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