DIRECT MEASUREMENT OF NA+ ION MOBILITY IN SIO2-FILMS

[1] SPACE-CHARGE-LIMITED IONIC CURRENTS IN SILICON DIOXIDE FILMS [J]. APPLIED PHYSICS LETTERS, 1967, 10 (10) : 291 - +

[2] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[3] KRIEGLER RJ, 1973, 11TH P REL PHYS S LA, P153

[4] Kriegler RJ., 12 INT REL S LAS VEG, P250, DOI [10.1109/IRPS.1974.362654, DOI 10.1109/IRPS.1974.362654]

[5] THEORY OF TRANSIENT SPACE-CHARGE-LIMITED CURRENTS IN SOLIDS IN PRESENCE OF TRAPPING [J]. PHYSICAL REVIEW, 1962, 126 (06): : 1980 - &

[6] MOBILE ION TRANSFER TO SIO2 FILMS FROM ETHANOL [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (06) : 1011 - &

[1] SPACE-CHARGE-LIMITED IONIC CURRENTS IN SILICON DIOXIDE FILMS [J]. APPLIED PHYSICS LETTERS, 1967, 10 (10) : 291 - +

[2] AN INVESTIGATION OF INSTABILITY AND CHARGE MOTION IN METAL-SILICON OXIDE-SILICON STRUCTURES [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1966, ED13 (02) : 222 - +

[3] KRIEGLER RJ, 1973, 11TH P REL PHYS S LA, P153

[4] Kriegler RJ., 12 INT REL S LAS VEG, P250, DOI [10.1109/IRPS.1974.362654, DOI 10.1109/IRPS.1974.362654]

[5] THEORY OF TRANSIENT SPACE-CHARGE-LIMITED CURRENTS IN SOLIDS IN PRESENCE OF TRAPPING [J]. PHYSICAL REVIEW, 1962, 126 (06): : 1980 - &

[6] MOBILE ION TRANSFER TO SIO2 FILMS FROM ETHANOL [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (06) : 1011 - &