TUNNELING CHARACTERISTICS OF DIFFERENT MODELS FOR THE METAL-VACUUM-METAL BARRIER

被引：11

作者：

GARCIA, R

机构：

[1] Departamento de Física de la Materia Condensada (C-III), Universidad Autnoma de Madrid, Ciudad Universitria de Canto Blanco

来源：

PHYSICAL REVIEW B | 1990年 / 42卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.42.5476

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Two different approaches for the one-dimensional metal-vacuum-metal interface potential are presented. They produce distinctive behaviors in the apparent-barrier-height dependence with the separation between electrodes. This suggests the measurement of the apparent barrier height as a method to discriminate between several models proposed for the metal-vacuum-metal barrier. © 1990 The American Physical Society.

引用

页码：5476 / 5480

页数：5

共 16 条

[1] ELECTRON INTERFEROMETRY AT CRYSTAL-SURFACES [J].

BECKER, RS ;

GOLOVCHENKO, JA ;

SWARTZENTRUBER, BS .

PHYSICAL REVIEW LETTERS, 1985, 55 (09) :987-990

[2]

BINNIG G, 1986, IBM J RES DEV, V30, P355

[3] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180

[4] CONDUCTANCE OSCILLATIONS IN SCANNING TUNNELING MICROSCOPY AS A PROBE OF THE SURFACE-POTENTIAL [J].

BONO, J ;

GOOD, RH .

SURFACE SCIENCE, 1987, 188 (1-2) :153-163

[5] PROPERTIES OF VACUUM TUNNELING CURRENTS - ANOMALOUS BARRIER HEIGHTS [J].

COOMBS, JH ;

PETHICA, JB .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :455-459

[6] EXPERIMENTAL BARRIER HEIGHTS AND THE IMAGE POTENTIAL IN SCANNING TUNNELING MICROSCOPY [J].

COOMBS, JH ;

WELLAND, ME ;

PETHICA, JB .

SURFACE SCIENCE, 1988, 198 (03) :L353-L358

[7] THEORY OF THE BIMETALLIC INTERFACE [J].

FERRANTE, J ;

SMITH, JR .

PHYSICAL REVIEW B, 1985, 31 (06) :3427-3434

[8] DISTANCE VOLTAGE CHARACTERISTICS IN SCANNING TUNNELING MICROSCOPY [J].

GARCIA, R ;

SAENZ, JJ ;

SOLER, JM ;

GARCIA, N .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (06) :L131-L134

[9] TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY [J].

GIMZEWSKI, JK ;

MOLLER, R .

PHYSICAL REVIEW B, 1987, 36 (02) :1284-1287

[10] HIGH PHI-VALUES IN SCANNING TUNNELING MICROSCOPY - FIELD-EMISSION AND TUNNEL REGIMES [J].

GOMEZHERRERO, J ;

GOMEZRODRIGUEZ, JM ;

GARCIA, R ;

BARO, AM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :445-449

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