SILICON-CRYSTAL DETERMINATION OF ABSOLUTE SCALE OF X-RAY WAVELENGTHS

被引：20

作者：

HENINS, I

BEARDEN, JA

机构：

来源：

PHYSICAL REVIEW | 1964年 / 135卷 / 4A期

关键词：

D O I：

10.1103/PhysRev.135.A890

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：A890 / +

共 63 条

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