GRAIN-BOUNDARY-PHASE IDENTIFICATION OF A LEAD-BASED RELAXOR BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引:37
作者
KANAI, H
YOSHIKI, M
HAYASHI, M
KUWAE, R
YAMASHITA, Y
机构
[1] Materials and Devices Research Laboratories, Research and Development Center, Toshiba Corporation, Kawasaki
关键词
D O I
10.1111/j.1151-2916.1994.tb07128.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
X-ray photoelectron spectroscopy was used to study a lead-based relaxor dielectric ceramic to identify the grain-boundary phase most likely to be responsible for the insulation degradation of relaxor dielectric ceramics under humid loading conditions. The grain-boundary phase consisted mainly of lead and oxygen. The binding energies of Pb4f7/2 and O1s in the grain-boundary phase were found to be 137.3 eV and 528.8 eV, respectively, and these values agreed well with those for Pb3O4 and PbO2. In addition, the broadness of the Pb4f7/2 peak suggested the presence of PbO. Measurements were made of lead dissolution from dielectric ceramics in hot water; specimens with a grain-boundary phase gave a 30 to 50 times greater lead concentration in the hot water than specimens without a grain-boundary phase. This demonstrated that the grain-boundary phase easily dissolved in hot water. Thus, it was concluded that the grain-boundary phase contained water-soluble PbO2 and PbO. The results strongly supported the resistance degradation mechanism of relaxor dielectric ceramics under humid loading conditions as previously proposed by the authors.
引用
收藏
页码:2229 / 2231
页数:3
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