DIRECT INFRARED MEASUREMENTS OF FILAMENT TRANSIENT TEMPERATURE DURING SWITCHING IN VANADIUM OXIDE FILM DEVICES

被引:25
作者
DUCHENE, J [1 ]
机构
[1] CEN,LETI EPA,BP 85,CENTRE TRI,38041 GRENOBLE,FRANCE
关键词
D O I
10.1016/0022-4596(75)90330-8
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
引用
收藏
页码:303 / 306
页数:4
相关论文
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[3]   ROLE OF CAPACITIVE DISCHARGE ENERGY IN SWITCHING OF SEMICONDUCTING GLASSES [J].
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[4]  
1973, IEEE T ELECTRON DEV, VED20