EASY DERIVATION OF THE FORMULA RELATING THE FLUCTUATIONS OF A BINARY-SYSTEM TO THE X-RAY-SCATTERING INTENSITY EXTRAPOLATED TO S = O

被引：18

作者：

HAYASHI, H ^{[1
]}

NISHIKAWA, K ^{[1
]}

IIJIMA, T ^{[1
]}

机构：

[1] GAKUSHUIN UNIV,FAC SCI,DEPT CHEM,TOSHIMA KU,TOKYO 171,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1990年 / 23卷

关键词：

D O I：

10.1107/S0021889889012331

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A.B. Bhatia & D.E. Thornton have derived the formula that relates the scattering intensity of a binary system to the Fourier transform of the local number density and concentration. For the intensity at the limit of zero scattering angle, the same formula can be derived by a much simpler process.

引用

页码：134 / 135

页数：2

共 6 条

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