DEPTH-SENSITIVE VISUALIZATION OF IRRADIATION-INDUCED COLUMNAR DEFECTS IN THE LAYERED SUPERCONDUCTOR 2H-NBSE2 VIA SCANNING PROBE MICROSCOPY

被引:21
作者
BAUER, P
GIETHMANN, C
KRAUS, M
MAREK, T
BURGER, J
KREISELMEYER, G
SAEMANNISCHENKO, G
SKIBOWSKI, M
机构
[1] UNIV ERLANGEN NURNBERG,INST WERKSTOFFWISSENSCH 7,D-91058 ERLANGEN,GERMANY
[2] CHRISTIAN ALBRECHTS UNIV KIEL,INST EXPTL PHYS,D-24118 KIEL,GERMANY
来源
EUROPHYSICS LETTERS | 1993年 / 23卷 / 08期
关键词
D O I
10.1209/0295-5075/23/8/008
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
For the first time irradiation-induced columnar defects have been visualized in a classical superconductor by means of scanning probe microscopy (SPM). These defects manifest themselves as hillocks or hollows in atomic-force microscope (AFM) images, depending on the scan direction. Using lateral-force microscopy (LFM) the observed structures can be identified as higher lateral forces within the defects. Depth-dependent measurements show that the mean diameter of the tracks decreases inside the NbSe2 crystals as a result of a reduction of the electronic energy loss S(e). The comparison of magnetization measurements before and after the irradiation with 500 MeV I-127 show an enhancement of the critical current density as it is known for pinning active columnar defects in high-T(c) materials after the irradiation with swift heavy ions.
引用
收藏
页码:585 / 591
页数:7
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