MEASUREMENT OF ABSOLUTE PARTICLE SURFACE SEPARATION USING TOTAL INTERNAL-REFLECTION MICROSCOPY AND RADIATION PRESSURE FORCES

被引：24

作者：

BROWN, MA

STAPLES, EJ

机构：

[1] Unilever Research, Port Sunlight Laboratory, Quarry Road East, Bebington, Wirral

来源：

LANGMUIR | 1990年 / 6卷 / 07期

关键词：

D O I：

10.1021/la00097a012

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We have previously show how total internal reflection microscopy and radiation pressure forces can be used to study weak interactions between particles and surfaces. The work described here illustrates how we have improved the experiment and extended the technique to measure absolute particle-surface separations as a function of NaCl electrolyte concentration. In so doing, we have shown how the dynamics of particles moving orthogonal to a plane surface can be studied. © 1990, American Chemical Society. All rights reserved.

引用

页码：1260 / 1265

页数：6

共 6 条

[1] A METHOD USING TOTAL INTERNAL-REFLECTION MICROSCOPY AND RADIATION PRESSURE TO STUDY WEAK INTERACTION FORCES OF PARTICLES NEAR SURFACES [J].