FABRICATION AND WAFER TESTING OF BARBER-POLE AND EXCHANGE-BIASED NARROW-TRACK MR SENSORS

被引：54

作者：

TSANG, C

FONTANA, RE

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1982年 / 18卷 / 06期

关键词：

D O I：

10.1109/TMAG.1982.1061996

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：1149 / 1151

页数：3

相关论文

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