NEED FOR NEW MEASUREMENTS OF FIELD-ION APPEARANCE POTENTIAL FOR HELIUM

[1] FORBES RG, 1975, 22ND INT FIELD EM S

[2] FORBES RG, TO BE PUBLISHED

[3] Goldenfield I. V., 1974, International Journal of Mass Spectrometry and Ion Physics, V13, P297, DOI 10.1016/0020-7381(74)83011-1

[4] APPEARANCE POTENTIALS OF FIELD IONS [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1974, A 29 (05): : 773 - 781

[5] A FIELD EMISSION RETARDING POTENTIAL METHOD FOR MEASURING WORK FUNCTIONS [J]. SURFACE SCIENCE, 1966, 4 (01) : 89 - &

[6] DYNAMICAL SCREENING EFFECTS IN ION-METAL SURFACE SCATTERING [J]. SURFACE SCIENCE, 1972, 32 (02) : 439 - &

[7] Richards W. G., 1969, INT J MASS SPECTROM, V2, P419

[8] ROLLGEN FW, 1975, Z NATURFORSCH A, V30, P913

[9] MEASUREMENT OF ENERGY DISTRIBUTION IN FIELD IONIZATION [J]. JOURNAL OF CHEMICAL PHYSICS, 1964, 41 (11) : 3279 - &

[10] WAUGH AR, 1975, THESIS CAMBRIDGE U

[1] FORBES RG, 1975, 22ND INT FIELD EM S

[2] FORBES RG, TO BE PUBLISHED

[3] Goldenfield I. V., 1974, International Journal of Mass Spectrometry and Ion Physics, V13, P297, DOI 10.1016/0020-7381(74)83011-1

[4] APPEARANCE POTENTIALS OF FIELD IONS [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1974, A 29 (05): : 773 - 781

[5] A FIELD EMISSION RETARDING POTENTIAL METHOD FOR MEASURING WORK FUNCTIONS [J]. SURFACE SCIENCE, 1966, 4 (01) : 89 - &

[6] DYNAMICAL SCREENING EFFECTS IN ION-METAL SURFACE SCATTERING [J]. SURFACE SCIENCE, 1972, 32 (02) : 439 - &

[7] Richards W. G., 1969, INT J MASS SPECTROM, V2, P419

[8] ROLLGEN FW, 1975, Z NATURFORSCH A, V30, P913

[9] MEASUREMENT OF ENERGY DISTRIBUTION IN FIELD IONIZATION [J]. JOURNAL OF CHEMICAL PHYSICS, 1964, 41 (11) : 3279 - &

[10] WAUGH AR, 1975, THESIS CAMBRIDGE U