CHARACTERIZATION OF NOISE IN INDUCTIVELY COUPLED PLASMA - ATOMIC EMISSION-SPECTROMETRY

被引：27

作者：

GOUDZWAARD, MP

DELOOSVOLLEBREGT, MTC

机构：

[1] Laboratory of Analytical Chemistry, Delft University of Technology, 2628 RZ Delft

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1990年 / 45卷 / 08期

关键词：

D O I：

10.1016/0584-8547(90)80144-8

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The noise in an inductively coupled plasma (ICP) atomic emission spectrometer was studied by variation of the ICP parameters and the measurement of the corresponding changes in the noise power spectrum. It was observed that the noise contained several components which varied differently when the ICP parameters were changed. Several noise components appeared to be constant and were probably related to the detection system. Other noise components varied and appeared to rise from the emission source and were proportional to the emission intensity. These components could also be measured when a solar cell was used as a detector to measure the total plasma emission intensity. The pulses of the peristaltic pump appeared to be the main source of low frequency noise. The effectiveness of different methods of noise reduction has been discussed with respect to these data. © 1990.

引用

页码：887 / 901

页数：15

共 16 条

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