SCANNING ELECTRON ACOUSTIC MICROSCOPY OF SIC PARTICLES IN METAL MATRIX COMPOSITES

被引：3

作者：

CANTRELL, JH ^{[1
]}

QIAN, ML ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1989年 / 122卷 / 01期

关键词：

D O I：

10.1016/0921-5093(89)90770-3

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：47 / 52

页数：6

共 10 条

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[J]. NATURE, 1980, 286 (5774) : 691 - 693
[3] DAVIES DG, 1983, I PHYS C SER, V68, P467
[4] Favro L. D., 1987, Photoacoustic and thermal wave phenomena in semiconductors, P69
[5] HOLSTEIN WL, 1984, SCAN ELECTRON MICROS, P1033
[6] IMAGE-FORMATION IN ELECTRON THERMOELASTIC ACOUSTIC MICROSCOPY
HOLSTEIN, WL
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (05) : 2008 - 2021
[7] SIGNAL GENERATION IN SCANNING ELECTRON ACOUSTIC MICROSCOPY
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CANTRELL, JH
[J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 122 (01): : 57 - 64
[8] QIAN M, 1989, 1989 P I AC OXF 5, V11, P453
[9] RINDGERMACHER HI, 1986, REV PROGR QUANTITA A, V5, P567
[10] THERMAL-WAVE IMAGING
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